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CVEs in KEV CVEs with EPSS >= 80% Crit. Microsoft High Apache SQL Injection (CWE-89) Linux Kernel High (CVSS 3.1) Apache Struts RCE (Remote Code Execution) XSS (CWE-79) Critical (CVSS 4.0) CVEs to check

Search Results (194 CVEs found)

CVE Vendors Products Updated CVSS v3.1
CVE-2025-21446 1 Qualcomm 481 Ar8035, Ar8035 Firmware, Ar9380 and 478 more 2025-08-11 7.5 High
Transient DOS may occur when processing vendor-specific information elements while parsing a WLAN frame for BTM requests.
CVE-2025-21466 1 Qualcomm 81 Aqt1000, Aqt1000 Firmware, Fastconnect 6200 and 78 more 2025-08-11 7.8 High
Memory corruption while processing a private escape command in an event trigger.
CVE-2025-27043 1 Qualcomm 413 Ar8035, Ar8035 Firmware, Csr8811 and 410 more 2025-08-11 7.8 High
Memory corruption while processing manipulated payload in video firmware.
CVE-2025-27047 1 Qualcomm 41 Fastconnect 6700, Fastconnect 6700 Firmware, Fastconnect 6900 and 38 more 2025-08-11 7.8 High
Memory corruption while processing the TESTPATTERNCONFIG escape path.
CVE-2025-27050 1 Qualcomm 81 Aqt1000, Aqt1000 Firmware, Fastconnect 6200 and 78 more 2025-08-11 7.8 High
Memory corruption while processing event close when client process terminates abruptly.
CVE-2025-27055 1 Qualcomm 80 Aqt1000, Aqt1000 Firmware, Fastconnect 6200 and 77 more 2025-08-11 7.8 High
Memory corruption during the image encoding process.
CVE-2024-21468 1 Qualcomm 460 205 Mobile, 205 Mobile Firmware, 215 Mobile and 457 more 2025-08-11 8.4 High
Memory corruption when there is failed unmap operation in GPU.
CVE-2024-21471 1 Qualcomm 350 205 Mobile, 205 Mobile Firmware, 215 Mobile and 347 more 2025-08-11 8.4 High
Memory corruption when IOMMU unmap of a GPU buffer fails in Linux.
CVE-2024-23369 1 Qualcomm 237 Ar8035, Ar8035 Firmware, Fastconnect 6200 and 234 more 2025-08-11 7.8 High
Memory corruption when invalid length is provided from HLOS for FRS/UDS request/response buffers.
CVE-2023-28547 1 Qualcomm 667 215 Mobile, 215 Mobile Firmware, 315 5g Iot and 664 more 2025-08-11 8.4 High
Memory corruption in SPS Application while requesting for public key in sorter TA.
CVE-2024-38397 1 Qualcomm 234 Ar8035, Ar8035 Firmware, Fastconnect 6700 and 231 more 2025-08-11 7.5 High
Transient DOS while parsing probe response and assoc response frame.
CVE-2025-21467 1 Qualcomm 212 215 Mobile, 215 Mobile Firmware, Csra6620 and 209 more 2025-08-11 7.8 High
Memory corruption while reading the FW response from the shared queue.
CVE-2025-21422 1 Qualcomm 443 Aqt1000, Aqt1000 Firmware, Ar8035 and 440 more 2025-08-11 7.1 High
Cryptographic issue while processing crypto API calls, missing checks may lead to corrupted key usage or IV reuses.
CVE-2024-33057 1 Qualcomm 356 Ar8035, Ar8035 Firmware, Csr8811 and 353 more 2025-08-11 7.5 High
Transient DOS while parsing the multi-link element Control field when common information length check is missing before updating the location.
CVE-2024-33042 1 Qualcomm 456 205, 205 Firmware, 215 and 453 more 2025-08-11 7.8 High
Memory corruption when Alternative Frequency offset value is set to 255.
CVE-2024-33052 1 Qualcomm 456 205 Mobile, 205 Mobile Firmware, 215 Mobile and 453 more 2025-08-11 7.8 High
Memory corruption when user provides data for FM HCI command control operations.
CVE-2024-33065 1 Qualcomm 81 Aqt1000, Aqt1000 Firmware, Fastconnect 6200 and 78 more 2025-08-11 8.4 High
Memory corruption while taking snapshot when an offset variable is set by camera driver.
CVE-2024-33073 1 Qualcomm 320 Ar8035, Ar8035 Firmware, Csr8811 and 317 more 2025-08-11 8.2 High
Information disclosure while parsing the BSS parameter change count or MLD capabilities fields of the ML IE.
CVE-2025-21475 1 Qualcomm 80 Aqt1000, Aqt1000 Firmware, Fastconnect 6200 and 77 more 2025-08-11 7.8 High
Memory corruption while processing escape code, when DisplayId is passed with large unsigned value.
CVE-2025-21453 1 Qualcomm 532 205 Mobile, 205 Mobile Firmware, 215 Mobile and 529 more 2025-08-11 7.8 High
Memory corruption while processing a data structure, when an iterator is accessed after it has been removed, potential failures occur.